Associate Director for Technology
U.S. Department of Energy—Advanced Research Projects Agency-Energy (ARPA-E)

Dr. Jennifer Gerbi currently serves as the Associate Director for Technology and a Program Director at the Advanced Research Projects Agency-Energy (ARPA-E), responsible for supporting the Deputy Director for Technology in oversight of all technology issues relating to ARPA-E’s programs as well as assisting with program development, Program Director recruitment, and coordinating project management across the Agency. Her programmatic focus at ARPA-E includes improving energy efficiency and management of buildings via advanced sensing systems and storage, novel insulating materials for windows, as well as renewable energy generation via photovoltaics.

Leader in technology and new business development with excellent cross-functional skills. Key strengths include technical feasibility assessment, business case building, strategy, program leadership, open innovation, portfolio management, communication, customer relationships, and risk mitigation. Expertise in semiconductor, electronic, and specialty silicone materials and markets. Integrates internal and external research, ventures, supply chain, technical scouting, marketing, and finance to deliver high validity program decisions and plans. Builds cross-functional teams to champion next-generation technologies across businesses. Delivers feasible technical portfolios to reach business goals while reducing risk. Deeply involved in intellectual capital generation and strategy, including white space evaluation and freedom to operate in multiple technical areas. 20 years experience in technical writing, including government proposal development and evaluation. Six patents, 38 external publications (> 2400 citations, h=20) Technical specialties: Six Sigma, electronic materials, wearables, sensors, thin films, silicones, semiconductors, energy, batteries, solar, photovoltaics, LiB, BIPV, BAPV, vacuum deposited thin films, next generation solar, wear coatings, diamond films, silicon, intellectual capital, semiconductors, MEMS, sputtering, CVD, XRD, NEXAFS/XANES, TEM, Raman spectroscopy, FTIR